Project/scholarship details

  • Funder

    FCT - Fundação para a Ciência e a Tecnologia, I.P.

  • Funder's country

    Portugal

  • Funding program

    POCI

  • Funding amount

    61,845.00 €

  • Start date

    2003-09-01

  • End date

    2007-08-31

Documents

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The role of microstructure in luminescent properties of Er-doped nanocrystallin...

Stepikhova, M.; Cerqueira, M. F.; Losurdo, M.; Giangregorio, M. M.; Alves, E.; Monteiro, T.; Soares, Manuel Jorge

In this contribution, we present a structural and photoluminescence (PL) analysis of Er-doped nanocrystalline silicon thin films produced by rf magnetron sputtering method. We show the strong influence of the presence of nanocrystalline fraction in films on their luminescence efficiency at 1.54 microm studied on a series of specially prepared samples with different crystallinity, i.e., percentage and sizes of S...

Date: 2004   |   Origin: RepositóriUM - Universidade do Minho
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Effect of the matrix on the 1.5 microm photoluminescence of Er-doped silicon qu...

Cerqueira, M. F.; Stepikhova, M.; Losurdo, M.; Monteiro, T.; Soares, Manuel Jorge; Peres, M.; Neves, A.; Alves, E.

Erbium doped nanocrystalline silicon thin films were produced by reactive magnetron r.f. sputtering. Their structural and chemical properties were studied by micro-Raman, spectroscopic ellipsometry and Rutherford backscattering spectroscopy. Films with different crystalline fraction and crystallite size were deposited by changing the deposition parameters. The impact of the composition and structure of Erbium i...

Date: 2006   |   Origin: RepositóriUM - Universidade do Minho
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Study of the oxygen role in the photoluminescence of erbium doped nanocrystalli...

Cerqueira, M. F.; Losurdo, M.; Monteiro, T.; Stepikhova, M.; Soares, M. J.; Peres, M.; Alves, E.; Conde, O.

We have produced and studied erbium doped nanocrystalline silicon thin films with different oxygen and hydrogen content in order to evaluate the influence of the matrix on the Er3+ emission and on the 0.89 eV and 1.17 eV bands. Films were grown by reactive magnetron sputtering on glass substrates under several different conditions (RF power, Er content and gas mixture composition) in order to obtain different m...

Date: 2006   |   Origin: RepositóriUM - Universidade do Minho
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Erbium-doped silicon nanocrystals grown by r.f. sputtering method: competition ...

Cerqueira, M. F.; Stepikhova, M.; Losurdo, M.; Giangregorio, M. M.; Kozanecki, A.; Monteiro, T.

Erbium doped micro- and nanocrystalline silicon thin films have been deposited by co-sputtering of Er and Si. Films with different crystallinity, crystallite size, hydrogen and oxygen content have been obtained in order to investigate the effect of the microstructure and composition of matrix on the near IR range at 1.54 µm Er-related photoluminescence (PL) properties. The correlation between the optical proper...

Date: 2006   |   Origin: RepositóriUM - Universidade do Minho
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Photoluminescence of nc-Si:Er thin films obtained by physical and chemical vapo...

Cerqueira, M. F.; Losurdo, M.; Stepikhova, M.; Alpuim, P.; Andrês, G.; Kozanecki, A.; Soares, Manuel Jorge; Peres, M.

Erbium doped nanocrystalline silicon (nc-Si:Er) thin films were produced by reactive magnetron rf sputtering and by Er ion implantation into chemical vapor deposited Si films. The structure and chemical composition of films obtained by the two approaches were studied by micro-Raman scattering, spectroscopic ellipsometry and Rutherford backscattering techniques. Variation of deposition parameters was used to dep...

Date: 2009   |   Origin: RepositóriUM - Universidade do Minho
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Effect of grain size and hydrogen passivation on the electrical properties of n...

Cerqueira, M. F.; Semikina, T. V.; Baidus, N. V.; Alves, E.

The properties of mixed-phase (nanocrystalline/amorphous) silicon layers produced by reactive RF-sputtering are described. The chemical composition and nanostructure [i.e. nanocrystal (NC) size and volume fraction] of the films were studied by Rutherford backscattering spectroscopy (RBS) and micro-Raman spectroscopy, respectively. Samples with different fractions of the nanocrystalline phase and NC mean size we...

Date: 2010   |   Origin: RepositóriUM - Universidade do Minho
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